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Authors: Samuel Riedel IIS, ETH Zürich ; Marc Gantenbein; Alessandro Ottaviano; Torsten Hoefler; Luca Benini
Journal title: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.23919/DATE58400.2024.10546857
ISSN: 1558-1101