Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Summary

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Authors: Philipp Hönicke, André Wählisch, Rainer Unterumsberger, Burkhard Beckhoff, Janusz Bogdanowicz, Anne-Laure Charley, Hans Mertens, Névine Rochat, Jean-Michel Hartmann, Narciso Giambacorti

Journal title: Nanotechnology

Journal number: 35

Journal publisher: IOP Publishing

Published year: 2024

DOI identifier: 10.1088/1361-6528/ad3aff

ISSN: 0957-4484