Novel metrology for mask degradation: IR-AFM, XPS depth profiling and HAXPES

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Authors: Véronique de Rooij, Shriparna Mukherjee, Chien-Ching Wu, Rob P. Ebeling, Komal Pandey, Maarten van Es, Rik Jonckheere

Journal title: Photomask Technology 2024

Journal publisher: SPIE

Published year: 2024

DOI identifier: 10.1117/12.3032757