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Authors: Michael Villamizar Vergel, Juan Andrade-Cetto, Alberto Sanfeliu, Francesc Moreno-Noguer
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 40/2
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 272-288
DOI identifier: 10.1109/TPAMI.2017.2676778
ISSN: 0162-8828
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