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Authors: Haitham Al-Obiedollah; Haythem A. Bany Salameh; Kanapathippillai Cumanan; Zhiguo Ding; Octavia A. Dobre
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2023
DOI identifier: 10.1109/access.2023.3284317
ISSN: 2169-3536
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