Battling Data Counterfeiting in Industrial Data Trading Environments

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Authors: Christos Panagiotou, Kyriakos Stefanidis

Journal title: 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA)

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.1109/ETFA61755.2024.10711059