Dielectric multilayers impact on radiation-induced charge accumulation in highly sensitive oxide field effect transistors

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Authors: Camilla Bordoni, Andrea Ciavatti, Mariana Cortinhal, Maria Pereira, Tobias Cramer, Pedro Barquinha, Beatrice Fraboni

Journal title: APL Materials

Journal number: 12

Journal publisher: AIP Publishing

Published year: 2024

DOI identifier: 10.1063/5.0189167

ISSN: 2166-532X