Accurate determination of band tail properties in amorphous semiconductor thin film with Kelvin probe force microscopy

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Authors: Luca Fabbri; Camilla Bordoni; Pedro Barquinha; Jerome Crocco; Beatrice Fraboni; Tobias Cramer

Journal title: APL Materials, Vol 11, Iss 6, Pp 061123-061123-8 (2023)

Journal publisher: AIP

Published year: 2023

DOI identifier: 10.48550/arxiv.2303.08442

ISSN: 2166-532X