An Empirical Study on Low- and High-Level Explanations of Deep Learning Misbehaviours

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Authors: Tahereh Zohdinasab, Vincenzo Riccio, Paolo Tonella

Journal title: Proceedings of the ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)

Journal publisher: IEEE Computer Society

Published year: 2023

DOI identifier: 10.1109/esem56168.2023.10304866