DeepAtash: Focused Test Generation for Deep Learning Systems

Summary

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Authors: Tahereh Zohdinasab, Vincenzo Riccio, Paolo Tonella

Journal title: Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA)

Journal publisher: ACM SIGSOFT

Published year: 2023

DOI identifier: 10.1145/3597926.3598109