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Authors: Jun Yin, Stefano Damiano, Marian Verhelst, Toon van Waterschoot, Andre Guntoro
Journal title: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2024
Published pages: 1-6
DOI identifier: 10.23919/date56975.2023.10137209
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