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Authors: Luca Fedeli, Axel Huebl, France Boillod-Cerneux, Thomas Clark, Kevin Gott, Conrad Hillairet, Stephan Jaure, Adrien Leblanc, Rémi Lehe, Andrew Myers, Christelle Piechurski, Mitsuhisa Sato, Neil Zaïm, Weiqun Zhang, Jean-Luc Vay, and Henri Vincenti
Journal title: SC22
Journal publisher: The Institute of Electrical and Electronics Engineers, Inc.
Published year: 2022
DOI identifier: 10.1109/sc41404.2022.00008
ISBN: 978-1-6654-5444-5