Establishing On-Wafer Calibration Standards for the 16-Term Error Model: Application to Silicon High-Frequency Transistor Characterization

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Authors: Sebastien Fregonese, Thomas Zimmer

Journal title: IEEE Journal of Microwaves

Journal number: 4

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2024

DOI identifier: 10.1109/JMW.2024.3413865

ISSN: 2692-8388