FASTA: Revisiting Fully Associative Memories in Computer Microarchitecture

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Authors: Esteban Garzón, Robert Hanhan, Marco Lanuzza, Adam Teman, Leonid Yavits

Journal title: IEEE Access

Journal number: 12

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2024

DOI identifier: 10.1109/access.2024.3355961

ISSN: 2169-3536