Open-circuit voltage degradation and trap-assisted tunneling in electron and proton-irradiated ultra-thin GaAs solar cells

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Authors: A. Barthel, S.-I. Sato, L. Sayre, J. Li, T. Nakamura, T. Ohshima, M. Imaizumi, L. C. Hirst

Journal title: Journal of Applied Physics

Journal number: 135

Journal publisher: American Institute of Physics

Published year: 2024

DOI identifier: 10.1063/5.0205238

ISSN: 0021-8979