Comparaison des Modles de Calibrage pour l'extraction des performances RF d'un Transistor HBT SiGE en haute frquence

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Authors: T. Bouzar, P. Billy, J. Varghese, J. D. Arnould, M. De Matos, T. Zimmer, S. Fregonese

Journal publisher: 1ere Journées techniques Radio-Frequency Test Facility Network

Published year: 2023