Deep Learning Approaches for Stress Detection: A Survey

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Authors: Maria Kyrou, IoannisSenior Kompatsiaris, Panagiotis C. Petrantonakis

Journal title: IEEE Transactions on Affective Computing

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2024

DOI identifier: 10.1109/TAFFC.2024.3455371

ISSN: 1949-3045