An Improved Screen Method of Chip Selection for Suppressing Current Imbalance Between Paralleled Devices

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Authors: Puzhen Yu, Bing Ji, Yuan Gao, Meng Luo, Kun Tan, Zhenmin Cheng

Journal title: 2024 International Symposium on Electrical, Electronics and Information Engineering (ISEEIE)

Journal publisher: IEEE ISEEIE

Published year: 2025

Published pages: 17-21

DOI identifier: 10.1109/iseeie62461.2024.00012