Electrical-Thermal Coupling Modeling of SiC MOSFETs Based on Field-Circuit Coupling and Its Application in Junction Temperature Calculation During Surges

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Authors: Yao Zhao, Zhiqiang Wang, Jinjun Wang, Yingbo Tang, Bing Ji, Cuili Chen, Guofeng Li

Journal title: IEEE Transactions on Power Electronics

Journal number: 40

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2025

Published pages: 2651-2667

DOI identifier: 10.1109/tpel.2024.3493382

ISSN: 0885-8993