Temperature Characteristics and Feasibility Study of Temperature-Sensitive Electrical Parameters under Short-Circuit Conditions for SiC MOSFETs

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Authors: Zekun Li, Bing Ji, Puzhen Yu, Kun Tan, Mohammed Arkate, Wenping Cao

Journal title: 2024 International Symposium on Electrical, Electronics and Information Engineering (ISEEIE)

Journal publisher: IEEE ISEEIE

Published year: 2025

Published pages: 6-11

DOI identifier: 10.1109/iseeie62461.2024.00010