Mitigating Shoot-Through Currents in Current-Controlled Gate Drivers

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Authors: Shuai Ding, Bing Ji, Zekun Li, Peichen Sun, Zhiqiang Wang, Yao Zhao

Journal title: 2024 International Symposium on Electrical, Electronics and Information Engineering (ISEEIE)

Journal publisher: IEEE ISEEIE

Published year: 2025

Published pages: 12-16

DOI identifier: 10.1109/iseeie62461.2024.00011