Gate Oxide Breakdown in IGBT Modules Due to Bonding Wires Lift-Off

Summary

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Authors: Zekun Li, Bing Ji, Kun Tan, Wenping Cao

Journal title: Lecture Notes in Electrical Engineering, Proceedings of the 3rd International Symposium on New Energy and Electrical Technology

Journal publisher: Springer Nature Singapore

Published year: 2023

Published pages: 458-466

DOI identifier: 10.1007/978-981-99-0553-9_49