Bulk Depolarization Fields as a Major Contributor to the Ferroelectric Reliability Performance in Lanthanum Doped Hf 0.5 Zr 0.5 O 2 Capacitors

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Authors: Furqan Mehmood, Michael Hoffmann, Patrick D. Lomenzo, Claudia Richter, Monica Materano, Thomas Mikolajick, Uwe Schroeder

Journal title: Advanced Materials Interfaces

Journal number: 6/21

Journal publisher: Wiley online

Published year: 2019

Published pages: 1901180

DOI identifier: 10.1002/admi.201901180

ISSN: 2196-7350