Huge Reduction of the Wake-Up Effect in Ferroelectric HZO Thin Films

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Authors: Jordan Bouaziz, Pedro Rojo Romeo, Nicolas Baboux, Bertrand Vilquin

Journal title: ACS Applied Electronic Materials

Journal number: 1/9

Journal publisher: ACS Appl. Electron. Mater.1

Published year: 2019

Published pages: 1740-1745

DOI identifier: 10.1021/acsaelm.9b00367

ISSN: 2637-6113