Imprint issue during retention tests for HfO 2 -based FRAM: An industrial challenge?

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Authors: J. Bouaziz, P. Rojo Romeo, N. Baboux, B. Vilquin

Journal title: Applied Physics Letters

Journal number: 118/8

Journal publisher: American Institute of Physics

Published year: 2021

Published pages: 082901

DOI identifier: 10.1063/5.0035687

ISSN: 0003-6951