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Authors: Alberto Bosio, Mayeul Cantan, Cedric Marchand, Ian O'Connor, Petr Fiser, Arnaud Poittevin, Marcello Traiola
Journal title: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Journal publisher: IEEE
Published year: 2021
Published pages: 93-98
DOI identifier: 10.1109/ddecs52668.2021.9417062
ISBN: 978-1-6654-3595-6
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