Intrinsic or nucleation-driven switching: An insight from nanoscopic analysis of negative capacitance Hf 1−x Zr x O 2 -based structures

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Authors: I. Stolichnov, M. Cavalieri, C. Gastaldi, M. Hoffmann, U. Schroeder, T. Mikolajick, A. M. Ionescu

Journal title: Applied Physics Letters

Journal number: 117/17

Journal publisher: American Institute of Physics

Published year: 2020

Published pages: 172902

DOI identifier: 10.1063/5.0021272

ISSN: 0003-6951