An accuracy assessment of the surface reflectance product from the EMIT imaging spectrometer

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Authors: Red Willow Coleman, David R. Thompson, Philip G. Brodrick, Eyal Ben Dor, Evan Cox, Carlos Pérez García-Pando, Todd Hoefen, Raymond F. Kokaly, John M. Meyer, Francisco Ochoa, Gregory S. Okin, Daniela Heller Pearlshtien, Gregg Swayze, Robert O. Green

Journal title: Remote Sensing of Environment

Journal number: 315

Journal publisher: Elsevier BV

Published year: 2024

Published pages: 114450

DOI identifier: 10.1016/j.rse.2024.114450

ISSN: 0034-4257