Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs

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Authors: Hardi Selg, Konstantin Shibin, Anton Tsertov, Maksim Jenihhin, Peeter Ellervee, Jaan Raik

Journal title: 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.1109/DFT63277.2024.10753541