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Authors: Mahdi Taheri, Natalia Cherezova, Samira Nazari, Ali Azarpeyvand, Tara Ghasempouri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin
Journal title: IEEE Transactions on Device and Materials Reliability
Journal number: 25
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2025
DOI identifier: 10.1109/TDMR.2024.3523386
ISSN: 1530-4388