Electrical trace analysis of superconducting nanowire photon-number-resolving detectors

Summary

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Authors: Schapeler, Timon; Lamberty, Niklas; Hummel, Thomas; Schlue, Fabian; Stefszky, Michael; Brecht, Benjamin; Silberhorn, Christine; Bartley, Tim J.

Journal title: Physical Review Applied

Journal publisher: American Physical Society

Published year: 2024

DOI identifier: 10.1103/PHYSREVAPPLIED.22.014024

ISSN: 2331-7019