Understanding Defects in Amorphous Silicon with Million‐Atom Simulations and Machine Learning

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Authors: Joe D. Morrow, Chinonso Ugwumadu, David A. Drabold, Stephen R. Elliott, Andrew L. Goodwin, Volker L. Deringer

Journal title: Angewandte Chemie

Journal number: 136

Journal publisher: Wiley

Published year: 2024

Published pages: e202403842

DOI identifier: 10.1002/ange.202403842

ISSN: 0044-8249