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Authors: Valero Laparra, Juan Emmanuel Johnson, Gustau Camps-Valls, Raúl Santos-Rodríguez, Jesús Malo
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 47
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2025
Published pages: 1293-1308
DOI identifier: 10.1109/tpami.2024.3495827
ISSN: 0162-8828