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Authors: Femke J. Witmans, Mathijs G. C. Mientjes, Maarten J. G. Kamphuis, Vince van de Sande, Xin Guan, Hans Bolten, Marcel A. Verheijen, Chuan Li, Joost Ridderbos, Erik P.A.M. Bakkers, Alexander Brinkman, Floris A. Zwanenburg
Journal title: Advanced Electronic Materials
Journal publisher: Wiley
Published year: 2025
DOI identifier: 10.1002/aelm.202500027
ISSN: 2199-160X
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