Analyzing the role of hole injection on the short circuit performance of p-GaN gate power HEMTs

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Authors: D. Wieland, B. Butej, M. Stabentheiner, C. Koller, D. Pogany, C. Ostermaier

Journal title: Microelectronics Reliability

Journal number: 169

Journal publisher: Elsevier BV

Published year: 2025

DOI identifier: 10.1016/J.MICROREL.2025.115722

ISSN: 0026-2714