In-Operation Junction Temperature Extraction for Cascode GaN Devices Based on Turn-Off Delay

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Authors: Zhebie Lu, Francesco Iannuzzo

Journal title: IEEE Transactions on Power Electronics

Journal number: 39

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2024

DOI identifier: 10.1109/TPEL.2024.3354166

ISSN: 0885-8993