High-Fidelity Zero-Shot Texture Anomaly Localization Using Feature Correspondence Analysis

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Authors: Ardelean, Andrei-Timotei; Weyrich, Tim

Journal title: Proc. IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)

Journal number: 10

Journal publisher: IEEE / Computer Vision Foundation (CVF)

Published year: 2024

Published pages: 1134-1144

DOI identifier: 10.1109/wacv57701.2024.00117