Cryogenic Analog 1T-ReRAM with Enhanced Dynamic Range and Suppressed Noise for Cold Neural Networks

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Authors: M.S. Ram, D. Lombardo, E. Zaccaria, D.F. Falcone, T. Stecconi, A. La Porta, M. Sousa, S. Reidt, A. Ferraris, C.B. Zota, V. Bragaglia, B. J. Offrein

Journal title: 2024 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2025

DOI identifier: 10.1109/IEDM50854.2024.10873313