Compact Model of Conductive-Metal-Oxide/HfO<sub>x</sub> Analog Filamentary ReRAM Devices

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Authors: Matteo Galetta, Donato Francesco Falcone, Stephan Menzel, Antonio La Porta, Tommaso Stecconi, Wooseok Choi, Bert Jan Offrein, Valeria Bragaglia

Journal title: 2024 IEEE European Solid-State Electronics Research Conference (ESSERC)

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.1109/ESSERC62670.2024.10719489