Read Noise Analysis in Analog Conductive-Metal-Oxide/HfO_x ReRAM Devices

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Authors: Davide G. F. Lombardo, Mamidala Saketh Ram, Tommaso Stecconi, Wooseok Choi, Antonio La Porta, Donato F. Falcone, Bert Offrein, Valeria Bragaglia

Journal title: 2024 Device Research Conference (DRC)

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.1109/DRC61706.2024.10643760