Summary
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Authors: Sahar Ben Rached, Isaac Lopez Agudo, Santiago Rodrigo, Medina Bandic, Artur Garcia-Saez, Sebastian Feld, Hans Van Someren, Eduard Alarcón, Carmen G. Almudéver, Sergi Abadal
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2025
DOI identifier: 10.1109/ACCESS.2025.3583218
ISSN: 2169-3536