Enhanced EMC—Advantages of partially known orientations in x-ray single particle imaging

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: August Wollter, Emiliano De Santis, Tomas Ekeberg, Erik G. Marklund, Carl Caleman

Journal title: The Journal of Chemical Physics

Journal number: 160

Journal publisher: AIP Publishing

Published year: 2025

DOI identifier: 10.1063/5.0188772

ISSN: 0021-9606