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Authors: A. Trabelsi, C. Cagli, T. Hirtzlin, S. Martin, O. Billoint, E. Vianello, V. Sousa, G. Bourgeois, F. Andrieu
Journal title: 2023 IEEE International Integrated Reliability Workshop (IIRW)
Journal publisher: IEEE
Published year: 2024
Published pages: 1-4
DOI identifier: 10.1109/iirw59383.2023.10477705