Investigating the CM Noise Generated by Different Configurations of Multiple Forward Converters

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Authors: Cathrine E. S. Feloups, Hafte H. Adhena, Niek Moonen, David Thomas, Frank Leferink

Journal title: 2023 International Symposium on Electromagnetic Compatibility – EMC Europe

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/emceurope57790.2023.10274401

ISBN: 979-8-3503-2400-6