Magnetic Image Sensor for Detecting Ferrous Contaminants in Nonferrous Scraps

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Authors: Yongli Wu, Tijmen Oudshoorn, Rik Mulder, Kees Van Beek, Peter Rem

Journal title: IEEE Sensors Journal

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2024

DOI identifier: 10.1109/JSEN.2024.3457799

ISSN: 1530-437X