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Authors: Yuanwei Liu, Chongjun Ouyang, Zhiguo Ding, Robert Schober
Journal title: Proceedings of the IEEE
Journal number: 112
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2024
Published pages: 1100-1148
DOI identifier: 10.1109/jproc.2024.3476675
ISSN: 0018-9219
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