Experimental Over-the-Air Diagnosis of 1-Bit RIS Based on Complex Signal Measurements

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Authors: Yifa Li, Fengchun Zhang, Kim Olesen, Zhinong Ying, Wei Fan

Journal title: IEEE Antennas and Wireless Propagation Letters

Journal number: 23

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2025

DOI identifier: 10.1109/LAWP.2024.3367377

ISSN: 1536-1225