Over-the-Air Diagnosis of 1-Bit RIS Based on Amplitude-Only Measurement

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Authors: Fengchun Zhang, Yifa Li, Gert Pedersen, Wei Fan

Journal title: IEEE Transactions on Vehicular Technology

Journal number: 74

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2025

DOI identifier: 10.1109/TVT.2024.3524597

ISSN: 0018-9545