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Authors: Michail Mavropoulos, Georgios Keramidas, Dimitris Nikolos
Journal title: 2021 IEEE European Test Symposium (ETS)
Journal publisher: IEEE
Published year: 2021
Published pages: 1-6
DOI identifier: 10.1109/ets50041.2021.9465447
ISBN: 978-1-6654-1849-2
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