Electrical and 850 nm Optical Characterization of Back-Gate Controlled 22 nm FDSOI PIN-Diodes Without Front-Gate

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Authors: Jelle H. T. Bakker, Marcin Ł. Motycki, Raymond J. E. Hueting, Anne-Johan Annema, Mark S. Oude Alink

Journal title: IEEE Journal of the Electron Devices Society

Journal number: 13

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2025

DOI identifier: 10.1109/JEDS.2025.3537290

ISSN: 2168-6734